JPH05850Y2 - - Google Patents

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Publication number
JPH05850Y2
JPH05850Y2 JP1988090052U JP9005288U JPH05850Y2 JP H05850 Y2 JPH05850 Y2 JP H05850Y2 JP 1988090052 U JP1988090052 U JP 1988090052U JP 9005288 U JP9005288 U JP 9005288U JP H05850 Y2 JPH05850 Y2 JP H05850Y2
Authority
JP
Japan
Prior art keywords
jig
optical axis
standard sample
ray
axis adjustment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988090052U
Other languages
English (en)
Japanese (ja)
Other versions
JPH01158952U (en]
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988090052U priority Critical patent/JPH05850Y2/ja
Publication of JPH01158952U publication Critical patent/JPH01158952U/ja
Application granted granted Critical
Publication of JPH05850Y2 publication Critical patent/JPH05850Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
JP1988090052U 1987-12-28 1988-07-08 Expired - Lifetime JPH05850Y2 (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988090052U JPH05850Y2 (en]) 1987-12-28 1988-07-08

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP19731887 1987-12-28
JP1988090052U JPH05850Y2 (en]) 1987-12-28 1988-07-08

Publications (2)

Publication Number Publication Date
JPH01158952U JPH01158952U (en]) 1989-11-02
JPH05850Y2 true JPH05850Y2 (en]) 1993-01-11

Family

ID=31718648

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988090052U Expired - Lifetime JPH05850Y2 (en]) 1987-12-28 1988-07-08

Country Status (1)

Country Link
JP (1) JPH05850Y2 (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010230481A (ja) * 2009-03-27 2010-10-14 Fujitsu Ltd 試料分析装置及び試料分析方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07107516B2 (ja) * 1987-12-15 1995-11-15 理学電機株式会社 Ｘ線回折装置のゴニオメータの自動光軸調整装置
JP6270215B2 (ja) 2013-11-25 2018-01-31 株式会社リガク Ｘ線分析装置の光軸調整装置
JP6270214B2 (ja) 2013-11-25 2018-01-31 株式会社リガク Ｘ線分析装置の光軸調整方法及びｘ線分析装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59183353A (ja) * 1983-04-04 1984-10-18 Rigaku Denki Kk 多結晶試料ｘ線回折装置の光学系調整方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010230481A (ja) * 2009-03-27 2010-10-14 Fujitsu Ltd 試料分析装置及び試料分析方法

Also Published As

Publication number Publication date
JPH01158952U (en]) 1989-11-02

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